Repository logo
  • English
  • Deutsch
  • Español
  • Français
  • Log In
    New user? Click here to register.Have you forgotten your password?
Universidad Panamericana
  • Communities & Collections
  • Research Outputs
  • Fundings & Projects
  • Researchers
  • Statistics
  • Feedback
  • English
  • Deutsch
  • Español
  • Français
  1. Home
  2. CRIS
  3. Publications
  4. Complexity Reduction in Analyzing Independence between Statistical Randomness Tests Using Mutual Information
 
  • Details
Options

Complexity Reduction in Analyzing Independence between Statistical Randomness Tests Using Mutual Information

Journal
Entropy
ISSN
1099-4300
Date Issued
2023
Author(s)
Jorge Augusto Karell-Albo
Carlos Miguel Legón-Pérez
Raisa Socorro-Llanes
Rojas, Omar  orcid-logo
Facultad de Ciencias Económicas y Empresariales - CampGDL  
Guillermo Sosa-Gómez
Type
Resource Types::text::journal::journal article
DOI
10.3390/e25111545
URL
https://scripta.up.edu.mx/handle/123456789/9871
Abstract
<jats:p>The advantages of using mutual information to evaluate the correlation between randomness tests have recently been demonstrated. However, it has been pointed out that the high complexity of this method limits its application in batteries with a greater number of tests. The main objective of this work is to reduce the complexity of the method based on mutual information for analyzing the independence between the statistical tests of randomness. The achieved complexity reduction is estimated theoretically and verified experimentally. A variant of the original method is proposed by modifying the step in which the significant values of the mutual information are determined. The correlation between the NIST battery tests was studied, and it was concluded that the modifications to the method do not significantly affect the ability to detect correlations. Due to the efficiency of the newly proposed method, its use is recommended to analyze other batteries of tests.</jats:p>

Copyright 2024 Universidad Panamericana
Términos y condiciones | Política de privacidad | Reglamento General

Built with DSpace-CRIS software - Extension maintained and optimized by - Hosting & support SCImago Lab

  • Cookie settings
  • Privacy policy
  • End User Agreement
  • Send Feedback